Apr 18, 2024  
2017-2018 Undergraduate Academic Catalog 
    
2017-2018 Undergraduate Academic Catalog [ARCHIVED CATALOG]

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EE 487 - Machine Vision

3 lecture hours 0 lab hours 3 credits
Course Description
This course introduces the student to machine vision technology and its applications. Topics include lighting equipments and techniques, image acquisition devices/systems and techniques, and image processing techniques. Interfacing machine vision systems to other engineering systems are also discussed. Laboratory experiments and a class project include introduction to various kinds of vision systems, image processing techniques, and applications. (prereq: senior standing in EE or CE)
Course Learning Outcomes
Upon successful completion of this course, the student will be able to:
  • Describe and apply the fundamental concepts of machine vision systems
  • Describe and apply the principles underlying the application of machine vision systems
  • Describe a variety of machine vision applications
  • Describe the application of machine vision systems to industrial processes
  • Write concise, professional technical reports

Prerequisites by Topic
  • Knowledge of a programming language
  • Knowledge of basics of physical science
  • Understanding of manufacturing processes

Course Topics
  • Introduction to machine vision, image sensing fundamentals, relationship to other disciplines (2 classes)
  • Optics and lighting: fundamentals, practical light sources, imaging by lensing (2 classes)
  • Cameras and sensors: rectangular and linear arrays, CCD sensor architectures (3 classes)
  • Image processors and algorithms: windowing (generalized areas of interest), Sobel operator histograms, SRI algorithms (4 classes)
  • Discussion of term paper requirements, one-hour exam (3 classes)
  • Inspection case studies - examples, pistons, disk brakes, dishes, light bulbs, very high speed bottle inspection in packaging lines (4 classes)
  • Perspective projective and pinhole camera models, world coordinates and transformations (2 classes)

Laboratory Topics
  • Students use the ITEX system to acquire images and measure the effect of f-stop changes on pixel intensity. They also learn basic software commands for the ITEX system
  • The second laboratory makes use of the OPCON linear array camera and processor. The camera field of view is computed and recorded, and a histogram of an edge is generated
  • Using the ITEX systems, students design and implement a program which inspects an object of their choice

Coordinator
Richard Kelnhofer



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